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장르/형태: | Case studies Cas, Études de |
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추가적인 물리적 형식: | Online version: Tompkins, Harland G. User's guide to ellipsometry. Boston : Academic Press, ©1993 (OCoLC)645782036 |
자료 유형: | 인터넷 자료 |
문서 유형 | 도서, 인터넷 자원 |
모든 저자 / 참여자: |
Harland G Tompkins |
ISBN: | 0126939500 9780126939507 |
OCLC 번호: | 26503363 |
설명: | xv, 260 pages : illustrations ; 24 cm |
내용: | Ch. 1. Theoretical Aspects -- Ch. 2. Instrumentation -- Ch. 3. Using Optical Parameters to Determine Material Properties -- Ch. 4. Determining Optical Parameters for Inaccessible Substrates and Unknown Films -- Ch. 5. Extremely Thin Films -- Ch. 6. The Special Case of Polysilicon -- Ch. 7. The Effect of Roughness -- Case Studies -- Case 1. Dissolution and Swelling of Thin Polymer Films -- Case 2. Ion Beam Interaction with Silicon -- Case 3. Dry Oxidation of Metals -- Case 4. Optical Properties of Sputtered Chromium Suboxide Thin Films -- Case 5. Ion-Assisted Film Growth of Zirconium Dioxide -- Case 6. Electrochemical/Ellipsometric Studies of Oxides on Metals -- Case 7. Amorphous Hydrogenated Carbon Films -- Case 8. Fluoropolymer Films on Silicon from Reactive Ion Etching -- Case 9. Various Films on InP -- Case 10. Benzotriazole and Benzimidazole on Copper -- Case 11. Gas Adsorption on Metal Surfaces -- Case 12. Silicon-Germanium Thin Films -- Case 13. Profiling of HgCdTe -- Case 14. Oxides and Nitrides of Silicon -- Appendix A: Del/Psi Trajectory Calculations -- Appendix B: Effective Medium Considerations -- Appendix C: Literature Values of Optical Constants of Various Materials. |
책임: | Harland G. Tompkins. |
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